UEDA Shoichi | Department of Electronics Faculty of Technology, Kanazawa University
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概要
Department of Electronics Faculty of Technology, Kanazawa University | 論文
- F and ^1H NMR and ESR in a-Si:F:H and a-Si:H
- Identification of a New Defect in Silicon Nitride Films
- Thermal Equilibration of Defect Density in Hydrogenated Amorphous Silicon-Germanium Alloys
- Comparison between ESR and CPM for the Gap States in a-Si-Ge:H
- Thin Film Patterning by Laser Lift-Off