Miyakawa Hiroyuki | Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION

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• Miyakawa Hiroyukiの詳細を見る
• 同名の論文著者
• Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATIONの論文著者

Semiconductor Device Engineering Laboratory, TOSHIBA CORPORATION | 論文

• A Novel Sensing Scheme with On-Chip Page Copy for Flexible Voltage NAND Flash Memories (Special Issue on ULSI Memory Technology)
• A Novel Threshold Voltage Distribution Measuring Technique for Flash EEPROM Devices (Special Issue on Microelectronic Test Structure)
• Statistical Memory Yield Analysis and Redundancy Design Considering Fabrication Line Improvement (Special Issue on LSI Memories)
• Time Dependent Resistance Increase in Poly-Si Load Resistor due to Hydrogen Diffusion from Plasma-Enhanced Chemical Vapor Deposition Silicon Nitride Film in High Density Static Random Access Memories
• The Damage Energy Transfer to Interfacial Oxide by Phosphorus Ion Implantation for Small Geometry Polysilicon to Polysilicon Contact

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