Chen Po-Ying | Department of Information Engineering, I-Shou University, No. 1, Sec. 1, Syuecheng Road, Dashu Township, Kaohsiung County, Taiwan 840, R.O.C.
スポンサーリンク
概要
- Chen Po-Yingの詳細を見る
- 同名の論文著者
- Department of Information Engineering, I-Shou University, No. 1, Sec. 1, Syuecheng Road, Dashu Township, Kaohsiung County, Taiwan 840, R.O.C.の論文著者
関連著者
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Yeh Wen-kuan
Department Of Electrical Engineering National University Of Kaohsiung
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Chen Po-Ying
Department of Information Engineering, I-Shou University, No. 1, Sec. 1, Syuecheng Road, Dashu Township, Kaohsiung County, Taiwan 840, R.O.C.
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Chen Po-Ying
Department of Information Engineering, I-Shou University, Kaohsiung County, Taiwan 840, R.O.C.
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Tsai Ming-hsing
Department Of Electronics Engineering National Chiao Tung University And National Nano Device Labora
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Lai Yi-shao
Stress-reliability Lab Advanced Semiconductor Engineering Inc.
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Kung Heng-yu
Department Of Electronic Engineering National University Of Kaohsiung
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Tsai Ming
Department Of Computer Science And Engineering National Sun Yat-sen University
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Lai Yi-Shao
Stress-Reliability Lab, Advanced Semiconductor Engineering, Inc., Nan-Tzu District, Kaohsiung, Taiwan 811, R.O.C.
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Chang YuKon
Department of Information Engineering, I-Shou University, Kaohsiung County, Taiwan 840, R.O.C.
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Chang Yukon
Department of Information Engineering, I-Shou University, No. 1, Sec. 1, Syuecheng Road, Dashu Township, Kaohsiung County, Taiwan 840, R.O.C.
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Tsai Ming
Department of Electronic Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Road, Nan-Tzu District, Kaohsiung, Taiwan 811, R.O.C.
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Jing Ming-Haw
Department of Information Engineering, I-Shou University, No. 1, Sec. 1, Syuecheng Road, Dashu Township, Kaohsiung County, Taiwan 840, R.O.C.
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Yeh Wen-Kuan
Department of Electronic Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Road, NanTzu District, Kaohsiung, Taiwan 811, R.O.C.
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Kung Heng-Yu
Department of Electronic Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Road, Nan-Tzu District, Kaohsiung, Taiwan 811, R.O.C.
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Yeh Wen-Kuan
Department of Electronic Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Road, Nan-Tzu District, Kaohsiung, Taiwan 811, R.O.C.
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Tsai Ming-Hsing
Department of Electronic Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Road, NanTzu District, Kaohsiung, Taiwan 811, R.O.C.
著作論文
- Reliability and Characteristics of Wafer-Level Chip-Scale Packages under Current Stress
- Investigation of the Relationship between Whole-Wafer Strength and Control of Its Edge Engineering