Nakajima Sadanojo | NTT Electronics Corp.
スポンサーリンク
概要
NTT Electronics Corp. | 論文
- A 40-Gb/s 8×8 ATM Switch LSI Using 0.25-μm CMOS/SIMOX(Special Issue on Multimedia, Network, and DRAM LSIs)
- Shrinkage of Grown-in Defects in Czochralski Silicon During Thermal Annealing in Vacuum
- Observation of Shrinkage Process by Annealing of Grown-in Defect in Cz-Si Crystal
- Carbon in Grown-in Defects in Czoehralski Silicon and Its Influence on Gate-Oxide Defects
- Octahedral Void Structure Observed in Grown-In Defects in the Bulk of Standard Czochralski-Si for MOS LSIs