Taguchi S | Tanaka Kikinzoku Kogyo K. K. Atugi-shi Jpn
スポンサーリンク
概要
関連著者
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Hamaguchi Chihiro
Deparimsnt Of Elecironics Facully Of Engineering Osaka University
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Matsuoka Toshimasa
Department Of Electronic Engineering Osaka University
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TAGUCHI Shigenari
Department of Electronic Engineering, Osaka University
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KAKIMOTO Seizo
Central Research Laboratories, Sharp Corporation
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Kakimoto S
Mitsubishi Electric Corp. Hyogo Jpn
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Kakimoto Seizo
Advanced Technology Research Laboratories Sharp Corporation
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Kakimoto Seizo
Central Research Laboratories Sharp Corporation
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Sugimoto Kazuo
Advanced Technology Research Laboratories Sharp Corporation
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Taguchi S
Tanaka Kikinzoku Kogyo K. K. Atugi-shi Jpn
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TANIGUCHI Kenji
Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co
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Hamaguchi Chihiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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UDA Keiichiro
Central Research Laboratories, Sharp Corporation
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Uda Keiichiro
Central Research Laboratories Sharp Corporation
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Taniguchi Kenji
Department Of Biotechnology Tottori University
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Matsuoka Toshimasa
Department of Electrical, Electronic and Information Engineering, Osaka University
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MATSUOKA Toshimasa
Faculty of Engineering, Osaka University
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TANIGUCHI Kenji
Faculty of Engineering, Osaka University
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Taguchi Shigenari
Faculty of Engineering, Osaka University
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Hamaguchi Chihiro
Faculty of Engineering, Osaka University
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Takagi Junkou
Central Research Laboratories, Sharp Corporation
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Takagi J
Sharp Corp. Nara Jpn
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Takagi Junkou
Central Research Laboratories Sharp Corporation
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Hamaguchi Chihiro
Faculty Of Engineering Osaka University
著作論文
- Influence of N_2O Oxynitridation on Interface Trap Generation in Surface-Channel p-Channel Metal Oxide Semiconductor Field Effect Transistors
- Influence of N_2O-Oxynitridation on Interface Trap Generation in Surface-Channel PMOSFETs
- Thickness Dependence of Furnace N_2O-Oxynitridation Effects on Breakdown of Thermal Oxides