Kawai Eiji | The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Techno
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The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Techno | 論文
- Fault-Tolerant and Self-Stabilizing Protocols Using an Unreliable Failure Detector
- A DFT Selection Method for Reducing Test Application Time of System-on-Chips(SoC Testing)(Test and Verification of VLSI)
- A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint(Test)(Dependable Computing)
- A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint
- Design for Two-Pattern Testability of Controller-Data Path Circuits