Wakayama Yutaka | Tanaka Solid Junction Project Erato Japan Science And Technology Corporation

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概要

• 同名の論文著者
• Tanaka Solid Junction Project Erato Japan Science And Technology Corporationの論文著者

関連著者

• Wakayama Yutaka

  Tanaka Solid Junction Project Erato Japan Science And Technology Corporation

• Tanaka Shun-ichiro

  Tanaka Solid Junction Project Erato Japan Science And Technology Corporation

• Wakayama Yutaka

  Tanaka Solid Junction Project, ERATO, Japan Science and Research Corporation,

• Takahashi Yoshihiro

  Department Of Applied Physics School Of Engineering Tohoku University

• Takahashi Y

  Tanaka Solid Junction Project Erato Japan Science And Research Corporation

• Takahashi Yoichi

  Department Of Nuclear Engineering Faculty Of Engineering University Of Tokyo

• Takahashi Yukihiro

  Central Research Laboratory Matsushita Electric Industrial Co. Ltd.

• Takahashi Yoshinori

  Division Of Electrical Electronic And Information Engineering Osaka University

• Takahashi Y

  National Inst. Animal Health Ibaraki Jpn

• Takahashi Yumiko

  Tanaka Solid Junction Project, ERATO, Japan Science and Research Corporation,

• Wakayama Y

  Tanaka Solid Junction Project Erato Japan Science And Technology Corporation

• Wakayama Yutaka

  Molecular Architecture Project Jrdc

• Tagami Takashi

  Tanaka Solid Junction Project Erato Japan Science And Technology Corporation

• TANAKA Shun-ichiro

  Tanaka Solid Junction Project, Japan Science and Technology Corporation

• Takahashi Y

  Department Of Molecular & Materials Sciences Kyushu University

• Kunitake Toyoki

  Molecular Architecture Project Jrdc

• Tanaka Shun-ichiro

  Tanaka Solid Junction Project, ERATO, Japan Science and Research Corporation

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著作論文

• Convergent Beam Electron Diffraction Measurement for Local Strain Distribution in Si around a NiSi2 Island
• Strain Distribution near Si/NiSi_2 Interface Measured by Convergent Beam Electron Diffraction
• Influence of Interfaces on Crystal Growth of Si in SiO_2/a-Si/Si0_2 Layered Structures
• Direct Observation of Ordered Bilayers in Cast Films of Double-Chain Ammonium Amphiphiles by Transmission Electron Microscopy
• Strain Effect on Electronic States of Si near a Si/NiSi_2 Interface Measured by Electron Nanoprobe Techniques

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