Yeh Wen-kuan | United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D

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• 同名の論文著者
• United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development Dの論文著者

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D | 論文

• A Low Thermal Budget High Performance 0.25-0.18 μm Merged Logic Device and Dynamic Random Access Memory Application
• Optimization of Active Geometry Configuration and Shallow Trench Isolation (STI) Stress for Advanced CMOS Devices
• The Effects of Super-Steep-Retrograde Indium Channel Profile on Deep Submicron n-Channel Metal-Oxide-Semiconductor Field-Effect Transistor
• A Novel Shallow Trench Isolation with Mint-Spacer Technology
• The Effects of Super-Steep-Retrograde Indium Channel Profile on Deep Submicron n-Channel Metal-Oxide-Semiconductor Field-Effect Transistor

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