Oizumi Munenori | Tsukuba Research And Development Center Texas Instruments Japan Limited
スポンサーリンク
概要
関連著者
-
Aoki K
Texas Instruments Japan Ltd. Ibaraki Jpn
-
Fukuda Yukio
Texas Instruments Tukuba Research & Development Center Limited
-
Fukuda Y
Ntt Optoelectronics Laboratories
-
Fukuda Yukio
Tsukuba Research And Development Center Texas Instruments Japan Limited
-
Aoki K
Toshiba Corp. Yokohama Jpn
-
Fukuda Yuji
Kansai Photon Science Institute Japan Atomic Energy Agency
-
Fukuda Yuji
JAEA
-
Oizumi Munenori
Tsukuba Research And Development Center Texas Instruments Japan Limited
-
Nemoto Satoru
Texas Instruments Tsukuba Research And Development Center Limited
-
OIZUMI Munenori
Texas Instruments Tsukuba Research and Development Center, Limited
-
AOKI Katsuhiro
Texas Instruments Tsukuba Research and Development Center, Limited
-
HASHIMOTO Satoshi
Texas Instruments Tsukuba Research and Development Center, Limited
-
Aoki Katsuhiro
Texas Instruments Tsukuba Research & Development Center Limited
-
Fukuda Yukio
Texas Instruments Tsukuba Research & Development Center Limited
-
OIZUMI Munenori
Tsukuba Research and Development Center, Texas Instruments Japan Limited
-
AOKI Katsuhiro
Tsukuba Research and Development Center, Texas Instruments Japan Limited
-
Hashimoto Satoshi
Texas Instruments Tsukuba Research And Development Center Limited
著作論文
- Control of Crystalline Structure and Electrical Properties of TaSiN Thin Film Formed by Reactive RF-Sputtering
- Temperature Dependence of TaSiN Thin Film Resistivity from Room Temperature to 900℃ : Semiconductors