OIZUMI Munenori | Tsukuba Research and Development Center, Texas Instruments Japan Limited
スポンサーリンク
概要
関連著者
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Aoki K
Texas Instruments Japan Ltd. Ibaraki Jpn
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Fukuda Yukio
Texas Instruments Tukuba Research & Development Center Limited
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Fukuda Y
Ntt Optoelectronics Laboratories
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Fukuda Yukio
Tsukuba Research And Development Center Texas Instruments Japan Limited
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Aoki K
Toshiba Corp. Yokohama Jpn
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Fukuda Yuji
Kansai Photon Science Institute Japan Atomic Energy Agency
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OIZUMI Munenori
Tsukuba Research and Development Center, Texas Instruments Japan Limited
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AOKI Katsuhiro
Tsukuba Research and Development Center, Texas Instruments Japan Limited
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Fukuda Yuji
JAEA
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Oizumi Munenori
Tsukuba Research And Development Center Texas Instruments Japan Limited
著作論文
- Temperature Dependence of TaSiN Thin Film Resistivity from Room Temperature to 900℃ : Semiconductors