Matsui Hiroyoshi | The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Techno
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- The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Technoの論文著者
The Authors Are With The Graduate School Of Information Science Nara Institute Of Science And Techno | 論文
- Fault-Tolerant and Self-Stabilizing Protocols Using an Unreliable Failure Detector
- A DFT Selection Method for Reducing Test Application Time of System-on-Chips(SoC Testing)(Test and Verification of VLSI)
- A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint(Test)(Dependable Computing)
- A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint
- Design for Two-Pattern Testability of Controller-Data Path Circuits