Yeom Geunyoung | Department Of Materials Engineering Sungkyunkwan University

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概要

• 同名の論文著者
• Department Of Materials Engineering Sungkyunkwan Universityの論文著者

関連著者

• Yeom Geunyoung

  Department Of Materials Engineering Sungkyunkwan University

• LEE Dohaing

  Department of Materials Engineering, SungKyunKwan University

• Yeom Geunyoung

  Department of Materials Engineering, SungKyunKwan University

• Lee Dohaing

  Department Of Materials Engineering Sungkyunkwan University

• Yeom Geunyoung

  Department of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, South Korea

• Park S

  Electronics And Telecommunications Res. Inst. Taejon Kor

• Kim Dongwoo

  Department Of Electrical Engineering And Computer Science Hanyang University

• CHUNG Minjae

  Department of Materials Engineering, SungKyunKwan University

• PARK Sangduk

  Department of Materials Engineering, SungKyunKwan University

• Chung Minjae

  Department Of Materials Engineering Sungkyunkwan University

• Yeom Geunyoung

  Department Of Materials Science & Engineering Sungkyunkwan University

• Lee Hyoyoung

  Department Of Materials Science & Engineering Sungkyunkwan University

• Cho Namgil

  Department of Materials Science & Engineering, Sungkyunkwan University, Jangan-Gu Chunchun-Dong 300,

• Sung Younjoon

  M&D Laboratory, Samsung Advanced Institute of Technology, San 14-1, Nongseo-Ri, Giheung-Eup, Yongin-

• PARK ByungJae

  Department of Materials Engineering, Sungkyunkwan University

• Park S

  Department Of Materials Engineering Sungkyunkwan University

• Sung Younjoon

  M&d Laboratory Samsung Advanced Institute Of Technology

• Kim Dongwoo

  Department Of Materials Science & Engineering Sungkyunkwan University

• Cho Namgil

  Department Of Materials Science & Engineering Sungkyunkwan University

• Park Byungjae

  Department Of Materials Engineering Sungkyunkwan University

• Kim Dongwoo

  Department of Applied Physics, Korea University, Seoul 136-713, Korea

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著作論文

• Damage during SiO_2 Etching by Low-Angle Forward Reflected Neutral Beam : Instrumentation, Measurement, and Fabrication Technology
• Effect of GaN Microlens Array on Efficiency of GaN-Based Blue-Light-Emitting Diodes
• Effects of Axial Magnetic Field on Neutral Beam Etching by Low-Angle Forward-Reflected Neutral Beam Method

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