OKADA Kenji | Micro Computer Division, Matsushita Electronics Corporation
スポンサーリンク
概要
関連著者
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岡田 健治
半導体MIRAI-ASET
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Okada K
Yamaguchi Univ. Yamaguchi Jpn
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岡田 健治
松下電器産業(株)
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OKADA Kenji
Micro Computer Division, Matsushita Electronics Corporation
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KAWASAKI Satoko
Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd.
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Kawasaki Satoko
Semiconductor Research Center Matsushita Electric Ind. Co. Ltd.
著作論文
- Extended Time Dependent Dielectric Breakdown Model Based on Anomalous Gate Area Dependence of Lifetime in Ultra Thin Silicon Dioxides
- Extended TDDB Model Based on Anomalous Gate Area Dependence in Ultra Thin Silicon Dioxides
- New Dielectric Breakdown Model of Local Wearout in Ultra Thin Silicon Dioxides