Kimura Shigeru | Fundamental Research Laboratories Nec Corporation
スポンサーリンク
概要
関連著者
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KOBAYASHI Kenji
Fundamental Research Laboratories, NEC Corporation
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KIMURA Shigeru
Fundamental Research Laboratories, NEC Corporation
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Kimura Shigeru
Fundamental Research Laboratories Nec Corporation
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Kobayashi Kenji
Fundamental Research Laboratories Nec Corporation
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TSUSAKA Yoshiyuki
Graduate School of Material Science, University of Hyogo
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KAGOSHIMA Yasushi
Graduate School of Material Science, University of Hyogo
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Takeda Shingo
Faculty Of Science Himeji Institute Of Technology
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Takeda Shingo
Graduate School Of Science Himeji Inst. Of Tech.
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竹田 精治
大阪大学・大学院理学研究科
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Sunakawa H
Nec Corp. Ibaraki Jpn
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Yamaguchi A
System Devices And Fundamental Research Nec Corporation
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YAMAGUCHI Atsushi
Fundamental Research Laboratories, NEC Corporation
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SUNAKAWA Haruo
Opto-electronics and High Frequency Device Research Laboratories, NEC Corporation
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KIMURA Akitaka
Opto-electronics and High Frequency Device Research Laboratories, NEC Corporation
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USUI Akira
Opto-electronics and High Frequency Device Research Laboratories, NEC Corporation
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Kagoshima Y
Photon Factory National Laboratory For High Energy Physics
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Kagoshima Yasushi
Faculty Of Science Himeji Institute Of Technology
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Matsui Junji
Graduate School of Science, Himeji Inst. of Tech.
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YOKOYAMA Kazushi
Faculty of Science, Himeji Institute of Technology
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KURIHARA Hideaki
Faculty of Science, Himeji Institute of Technology
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URAKAWA Masafumi
Faculty of Science, Himeji Institute of Technology
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TSUSAKA Yoshiyuki
Faculty of Science, Himeji Institute of Technology
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Matsui Junji
Faculty of Science, Himeji Institute of Technology
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KIMURA Hidekazu
Fundamental Research Laboratories, NEC Corporation
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lZUMI Koichi
Fundamental Research Laboratories, NEC Corporation
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Yamaguchi A.atsushi
Fundamental Research Laboratories Nec Corporation
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Usui A
Nec Corp. Ibaraki Jpn
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Usui Akira
Optoelectronics And High Frequency Device Research Laboratories Nec Corporation
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Usui A
Aist Ibaraki
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Lzumi Koichi
Fundamental Research Laboratories Nec Corporation
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Matsui Junji
Center For Advanced Science And Technologies
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Izumi Koichi
Fundamental Reserch Laboratories Nec Corporation
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Izumi Koichi
Fundamental Research Laboratories Nec Corporation
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Kimura Hidekazu
Faculty Of Science Himeji Institute Of Technology
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Kimura A
Photonic And Wireless Devices Research Laboratories Nec Corporation
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Sudo Sinya
Optical Semiconductor Department Nec Compound Semiconductor Devices Ltd.
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Sakata Yasutaka
Compound Semiconductor Device Department Nec Kansai Ltd.
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Kimura S
Fundamental Research Laboratories Nec Corporation
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KAGOSHIMAI Yasushi
Graduate School of Science, Himeji Institute of Technology
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YOKOYAMA Yoshiyuki
Graduate School of Science, Himeji Institute of Technology
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NIIMI Toshihiro
Graduate School of Science, Himeji Institute of Technology
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TSUSAKAI Yoshiyuki
Graduate School of Science, Himeji Institute of Technology
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MATSUII Junji
Graduate School of Science, Himeji Institute of Technology
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Kimura Hidekazu
Fundamental Research Laboratories Nec Corporation
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Kurihara Hideaki
The Department Of Surgery The Jikei University School Of Medicine
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Usui Akira
Opto-electronics And High Frequency Device Research Laboratories Nec Corporation
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Kagoshima Y
Graduate School Of Material Science University Of Hyogo
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Matsuii Junji
Graduate School Of Science Himeji Institute Of Technology
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Tsusaka Yoshiyuki
Graduate School Of Material Science University Of Hyogo
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Tsusaka Yoshiyuki
Faculty Of Science Himeji Institute Of Technology
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Kagoshimai Yasushi
Graduate School Of Science Himeji Institute Of Technology
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Tsusakai Yoshiyuki
Graduate School Of Science Himeji Institute Of Technology
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Niimi Toshihiro
Graduate School Of Science Himeji Institute Of Technology
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Urakawa Masafumi
Faculty Of Science Himeji Institute Of Technology
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Yokoyama Yoshiyuki
Graduate School Of Science Himeji Institute Of Technology
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Kagoshima Yasushi
Graduate School and Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
著作論文
- X-Ray Rocking Curve Determination of Twist and Tilt Angles in GaN Films Grown by an Epitaxial-Lateral-Overgrowth Technique
- Formation of Parallel X-Ray Microbeam and Its Application
- Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-Ray Diffraction Method With Sub-μm Spatial Resolution : Instrumentation, Measurement, and Fabrication Technology