Chou J‐w | United Microelectronics Corp.
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概要
United Microelectronics Corp. | 論文
- Investigation of Defect Reduction on Copper Chemical-Mechanical Polishing for Advanced BEOL Interconnections
- Mechanism of Threshold Voltage Shift (ΔV_) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs
- Mechanism of Threshold Voltage Shift (ΔV_) Caused by Negative Bias Temperature Instability (NBTI) in Deep Sub-Micron pMOSFETs
- A Decoupled Capacitance Measurement Technique for Characterization of Small-Geometry MOSFETs with Ultra-Thin Gate Oxides
- An Efficient Process-Evaluation Method for Ultra-Thin Gate Oxides