Murakata Masami | Semiconductor Da & Test Engineering Center Toshiba Corporation
スポンサーリンク
概要
関連著者
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MURAKATA Masami
Semiconductor Technology Academic Research Center (STARC)
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Murakata Masami
Semiconductor Da & Test Engineering Center Toshiba Corporation
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YASUFUKU Tadashi
The University of Tokyo
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ISHIDA Koichi
The University of Tokyo
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TAKAMIYA Makoto
The University of Tokyo
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SAKURAI Takayasu
The University of Tokyo
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Yamada Masaaki
Semiconductor Da & Test Center Toshiba Corporation
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NIIYAMA Taro
The University of Tokyo
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PIAO Zhe
The University of Tokyo
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Takamiya Makoto
Institute Of Industrial Science The University Of Tokyo
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Sakurai Takayasu
Institute Of Industrial Science The University Of Tokyo
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Yamada Masaaki
Semiconductor Da & Test Engineering Center Toshiba Corporation
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KURIBAYASHI Mototaka
Semiconductor DA & Test Engineering Center, Toshiba Corporation
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TAKEUCHI Hideki
Semiconductor DA & Test Engineering Center, Toshiba Corporation
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Takeuchi Hideki
Semiconductor Da & Test Engineering Center Toshiba Corporation
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Kuribayashi Mototaka
Semiconductor Da & Test Engineering Center Toshiba Corporation
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Takamiya Makoto
The Univ. Of Tokyo
著作論文
- Difficulty of Power Supply Voltage Scaling in Large Scale Subthreshold Logic Circuits
- SCR : SPICE Netlist Reduction Tool (Special Section on Selected Papers from the 11th Workshop on Circuits and Systems in Karuizawa)