Stemmer Susanne | Materials Department University Of California
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概要
関連著者
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Stemmer Susanne
Materials Department University Of California
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Klenov Dmitri
Materials Department University Of California
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Son Junwoo
Materials Department University Of California
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Boesch Damien
Materials Department University Of California
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Cagnon Joel
Materials Department University Of California
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Gisby John
Npl Materials Centre National Physical Laboratory
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Foran Brendan
International Sematech
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Lebeau James
Materials Department University Of California
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Lysaght Patrick
International Sematech
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Boesch Damien
Materials Department, University of California, Santa Barbara, CA 93106-5050, U.S.A.
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Son Junwoo
Materials Department, University of California, Santa Barbara, CA 93106-5050, U.S.A.
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Cagnon Joël
Materials Department, University of California, Santa Barbara, CA 93106-5050, U.S.A.
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Schlom Darrell
Department Of Electrical Engineering Stanford University
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Chen Zhiqiang
Materials Department, University of California, Santa Barbara, CA 93106, USA
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Levi Carlos
Materials Department, University of California, Santa Barbara, CA 93106, USA
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Taylor Jeff
Johnson Matthey Technology Centre, Sonning Common, Reading RG4 9NH, UK
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Chen Zhiqiang
Materials Department University Of California
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Taylor Jeff
Johnson Matthey Technology Centre
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Levi Carlos
Materials Department University Of California
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Li Hao
Microelectronics and Physical Sciences Laboratory, Motorola, 2100 E. Elliot Rd., Tempe, AZ 85284, U.S.A.
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Schlom Darrell
Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA 16802-5005, U.S.A.
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Stemmer Susanne
Materials Department, University of California, Santa Barbara, CA 93106-5050, U.S.A.
著作論文
- Thickness Dependence of the Dielectric Properties of Epitaxial SrTiO3 Films on (001)Pt/SrTiO3
- Application of Metastable Phase Diagrams to Silicate Thin Films for Alternative Gate Dielectrics
- Epitaxial SrTiO3 Tunnel Barriers on Pt/MgO Substrates
- The Interface between Single Crystalline (001) LaAlO3 and (001) Silicon
- Limitations in Through-Focus Depth Sectioning in Non-Aberration Corrected High-Angle Annular Dark-Field Imaging