Limitations in Through-Focus Depth Sectioning in Non-Aberration Corrected High-Angle Annular Dark-Field Imaging

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概要

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• The focus dependence of atom column intensities in high-angle annular dark-field (HAADF) images is investigated as a function of sample thickness for two different materials, InP and SrTiO3. We show that even for very thick samples, the column intensities in both materials are maximized if the probe is focused near the entrance sample surface. Atom column intensities decrease for focus settings away from the optimum focus. The results show that HAADF through-focus series with a non-aberration corrected probe do not allow for atomically resolved depth sectioning in zone-axis crystals.

• Japan Society of Applied Physicsの論文
• 2006-06-25

著者

• Klenov Dmitri

  Materials Department University Of California

• Stemmer Susanne

  Materials Department University Of California

• Stemmer Susanne

  Materials Department, University of California, Santa Barbara, CA 93106-5050, U.S.A.

関連論文

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• The Interface between Single Crystalline (001) LaAlO3 and (001) Silicon
• Limitations in Through-Focus Depth Sectioning in Non-Aberration Corrected High-Angle Annular Dark-Field Imaging

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