Eikyu Katsumi | Ulsi Research And Development Center Mitsubishi Electric Corporation
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Ulsi Research And Development Center Mitsubishi Electric Corporation | 論文
- Channel Characteristics and Performance of MIMO E-SDM Systems in an Indoor Time-Varying Fading Environment
- Partially Depleted SOI Technology with Body-Tied Hybrid Trench Isolation for High-Speed System-On-a-Chip Application(Special Issue on Integrated Systems with New Concepts)
- Direct Measurement of Transient Drain Currents in Partially-Depleted SOI N-Channel MOSFETs Using a Nuclear Microprobe for Highly Reliable Device Designs
- Analyses of the Radiation-Caused Characteristics Change in SOI MOSFETs Using Field Shield Isolation
- Analysis and Optimization of Floating Body Cell Operation for High-Speed SOI-DRAM (Special Issue on Ultra-High-Speed IC and LSI Technology)