Kawakubo Takashi | Toshiba Res. Consulting Corp. Kawasaki Jpn
スポンサーリンク
概要
関連著者
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Kawakubo Takashi
Toshiba Res. Consulting Corp. Kawasaki Jpn
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KAWAKUBO Takashi
Toshiba Research Consulting Corporation
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NAGANO Toshihiko
Toshiba Corporation, Corporate Research and Development Center
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NISHIGAKI Michihiko
Toshiba Corporation, Corporate Research and Development Center
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Nagano Toshihiko
Toshiba Corporation Corporate Research And Development Center
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Itaya Kazuhiko
Toshiba Corporation Corporate Research And Development Center
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Nishigaki Michihiko
Toshiba Corporation Corporate Research And Development Center
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ITAYA Kazuhiko
Toshiba Corporation, Advanced Semiconductor Devices Research Laboratories
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ITAYA Kazuhiko
Advanced Semiconductor Devices Research Laboratories, R&D Center, Toshiba Corporation
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Itaya Kazuhiko
Toshiba Corporation Advanced Semiconductor Devices Research Laboratories
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NISHIGAKI Michihiko
Advanced Electron Devices Laboratory, Corporate Research & Development Center, Toshiba Corporation
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NAGANO Toshihiko
Advanced Electron Devices Laboratory, Corporate Research & Development Center, Toshiba Corporation
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MIYAZAKI Takashi
Advanced Electron Devices Laboratory, Corporate Research & Development Center, Toshiba Corporation
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Miyazaki Takashi
Advanced Electron Devices Laboratory Corporate Research & Development Center Toshiba Corporation
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Itaya Kazuhiko
Electron Devices Laboratory, Corporate Research & Development Center, Toshiba Corporation, 1 Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
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Itaya Kazuhiko
Electron Devices Laboratory, Toshiba Corporation, 1 Komukai-Toshiba-cho, Kawasaki 212-8582, Japan
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Nagano Toshihiko
Electron Devices Laboratory, Toshiba Corporation, 1 Komukai-Toshiba-cho, Kawasaki 212-8582, Japan
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Nishigaki Michihiko
Electron Devices Laboratory, Toshiba Corporation, 1 Komukai-Toshiba-cho, Kawasaki 212-8582, Japan
著作論文
- High-Q Piezoelectrically Actuated RF MEMS Tunable Capacitor
- Low-Voltage Operated Piezoelectric Tunable Capacitor for Reconfigurable RF Systems
- Optimization of Deposition Process and Microscopic Characterization of Highly Oriented Aluminum Nitride Thin Films for Bimorph Structures of Piezoelectric Tunable Capacitors