SUMIE Shingo | LEO Division, Kobelco Research Institute, Inc.
スポンサーリンク
概要
関連著者
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SUMIE Shingo
LEO Division, Kobelco Research Institute, Inc.
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HASHIZUME Hidehisa
LEO Division, Kobelco Research Institute, Inc.
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Mori Tatsuhiro
Department Of Engineering Physics Electronics And Mechanics Nagoya Institute Of Technology
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Ichimura Masaya
Department Of Electrical & Computer Engineering Nagoya Institute Of Technology
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Kato Masashi
Department Of Applied Biological Chemistry Faculty Of Agriculture Meijo University
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KATO Masashi
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology
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ICHIMURA Masaya
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology
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ARAI Eisuke
Department of Electrical and Computer Engineering, Nagoya Institute of Technology
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Watanabe Hideki
Department Of Cardiology Kinu Medical Association Hospital
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Kato M
Japan Atomic Energy Res. Inst. Ibaraki Jpn
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MORI Tatsuhiro
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology
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Arai Eisuke
Department Of Electrical Ad Computer Engineering Nagoya Institute Of Technology
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Watanabe Hideki
Departement Of Cardiology Kinu Medical Association Hospital
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Kawai Masahiko
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Nagoya 466-8555, Japan
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Kato Masashi
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Gokiso, Showa-ku, Nagoya 466-8555, Japan
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Mori Tatsuhiro
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Nagoya 466-8555, Japan
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Mori Tatsuhiro
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Gokiso, Showa-ku, Nagoya 466-8555, Japan
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Hashizume Hidehisa
LEO Division, Kobelco Research Institute, Inc., Kobe 651-2271, Japan
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Sumie Shingo
LEO Division, Kobelco Research Institute, Inc., Kobe 651-2271, Japan
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Sumie Shingo
LEO Division, Kobelco Research Institute, Inc., 1-5-5 Takatsukadai 1-chome, Nishi-ku, Kobe 651-2271, Japan
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Watanabe Hideki
Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Gokiso, Showa-ku, Nagoya 466-8555, Japan
著作論文
- Excess Carrier Lifetime Measurement of Bulk SiC Wafers and Its Relationship with Structural Defect Distribution
- Excess Carrier Lifetime in a Bulk p-Type 4H–SiC Wafer Measured by the Microwave Photoconductivity Decay Method
- Excess Carrier Lifetime Measurement of Bulk SiC Wafers and Its Relationship with Structural Defect Distribution