TSAI Kou-Chiang | Department of Materials Science and Engineering, National Chiao Tung University

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概要

• 同名の論文著者
• Department of Materials Science and Engineering, National Chiao Tung Universityの論文著者

関連著者

• Wu Wen-fa

  National Nano Device Laboratories

• TSAI Kou-Chiang

  Department of Materials Science and Engineering, National Chiao Tung University

• Lee Jain-tsai

  Department Of Materials Science And Engineering National Chiao-tung University

• CHAO Chuen-Guang

  Department of Materials Science and Engineering, National Chiao-Tung University

• Chao Chuen-guang

  Department Of Material Sciences And Engineering National Chiao Tung University

• HSU Jwo-Lun

  National Nano Device Laboratories

• Wu Chi-chang

  Department Of Electronic Engineering Feng-chia University

• SHEN Shih-Wen

  National Nano Device Laboratory

• Chao Chuen-guang

  Department Of Materials Science And Engineering National Chiao-tung University

• Shen Shih-wen

  National Nano Device Laboratories

• TSAI Kou-Chiang

  National Nano Device Laboratories

• KUAN Cheng-Ping

  National Nano Device Laboratories

• WU Chi-Chang

  National Nano Device Laboratories

• Wu Wen-Fa

  National Nano Device Laboratories, No. 26 Prosperity Road 1, Science-based Industrial Park, Hsinchu, Taiwan, Republic of China

• Shen Shih-Wen

  National Nano Device Laboratories, No. 26 Prosperity Road 1, Science-based Industrial Park, Hsinchu, Taiwan, Republic of China

• Tsai Kou-Chiang

  Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu, Taiwan, Republic of China

• Lee Jain-Tsai

  Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu, Taiwan, Republic of China

• Hsu Jwo-Lun

  National Nano Device Laboratories, No. 26 Prosperity Road 1, Science-based Industrial Park, Hsinchu, Taiwan, Republic of China

• Chao Chuen-Guang

  Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu, Taiwan, Republic of China

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著作論文

• Improving Electrical Properties and Thermal Stability of (Ba,Sr)TiO_3 Thin Films on Cu(Mg) Bottom Electrodes
• Repairing of Etching-Induced Damage of High-k Ba_Sr_TiO_3 Thin Films by Oxygen Surface Plasma Treatment
• Improving Characteristics of Tantalum Oxide Thin Film Devices with Copper Electrodes
• Improving Electrical Properties and Thermal Stability of (Ba,Sr)TiO3 Thin Films on Cu(Mg) Bottom Electrodes
• Repairing of Etching-Induced Damage of High-$k$ Ba0.5Sr0.5TiO3 Thin Films by Oxygen Surface Plasma Treatment

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