Sakamoto T | Univ. Tokyo Tokyo
スポンサーリンク
概要
関連著者
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Sakamoto T
Univ. Tokyo Tokyo
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Oizumi H
Electrotechnical Laboratory
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Oyanagi Hiroyuki
Electrotechnical Laboratory
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SAKAMOTO Tsunenori
Electrotechnical Laboratory
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SAKAMOTO Kunihiro
Electrotechnical Laboratory
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OYANAGI Hiroyuki
National Institute for Advanced Industrial Science and Technology
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Oyanagi Hiroyuki
Optoelectronics Division Electrotechnical Laboratory
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SAKAMOTO Keishi
Japan Atomic Energy Agency
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Oyanagi H
Optoelectronics Division Electrotechnical Laboratory
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Oyanagi Hiroyuki
Electrotech. Lab. Tsukuba
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OYANAGI Hiroyuki
Electrotech. Lab. , Tsukuba
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中村 裕之
Graduate School Of Material Science University Of Hyogo
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SAKAMOTO Takeshi
Department of Urology, Osaka Medical College
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WADA Akiyoshi
Department of Physics, Faculty of Science, University of Tokyo
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Sakamoto Takeshi
Department Of Orthopaedic Surgery Kyoto University Graduate School Of Medicine
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Wada A
Univ. Tsukuba Ibaraki
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Wada Akiyoshi
Department Of Physics Faculty Of Science The University Of Tokyo
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Sakamoto Takeshi
Department Of Chemistry And Biotechnology School Of Engineering The University Of Tokyo
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Sakamoto Takeshi
Department of Biofunctional Science, Faculty of Agriculture and Life Science, Hirosaki University
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ISHIGURO Takehiko
Electrotechnical Laboratory
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YAO Takafumi
Electrotechnical Laboratory
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Ishiguro T
Kyoto Univ. Kyoto
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NAKAMURA HARUKI
Department of Applied Physics, Faculty of Engineering, University of Tokyo
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Matsushita T
Osaka Sangyo Univ. Osaka Jpn
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Matsushita Tadashi
National Laboratory For High Energy Physics
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SHIODA Ryu
Electrotechnical Laboratory
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Ishiguro Takehiko
Electrotechincal Laboratory
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Nakamura Haruki
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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NAKAMURA Haruki
Protein Engineering Research Institute
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ISHIGURO Takashi
Department of Electrical Engineering, Nagaoka University of Technology
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Ishiguro T
Nagaoka Univ. Technol. Nagaoka Jpn
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Yao Takafumi
Electrical Laboratory
著作論文
- Si/Ge/Si Monolayer Heterostructure on Si(100) Studied by Surface-Sensitive EXAFS
- Ge Epitaxial Overlayers on Si(001) Studied by Surface-Sensitive X-Ray Absorption Fine Structure: Evidence for Strain-Induced Surface Rearrangement
- Heterointerfaces in Strained-Layer Superlattices Studied by Surface-Sensitive XAFS
- Dielectric Relaxation Measurements of Hydrated Powder at Subzero Temperatures by Time-Domain Reflectometry : Electrical Properties of Condensed Matter
- Nature of the Charge Destribution in Proteins.II.Effect of Atomic Partial Charges on Ionic Charges