YANG Dao-Hong | Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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概要
- 同名の論文著者
- Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung Universityの論文著者
関連著者
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Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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YANG Dao-Hong
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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CHEN Jone
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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Wu Shien-yang
Logic Technology Division/r&d Taiwan Semiconductor Manufacturing Company
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Chen Jone
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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LIN Chih-Yung
Logic Technology Division/R&D, Taiwan Semiconductor Manufacturing Company
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Wu Shien-Yang
Platform-1 Division/R&D, Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
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Yang Dao-Hong
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Lin Chih-Yung
Platform-1 Division/R&D, Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
著作論文
- Effect of Mobility Degradation and Supply Voltage on NBTI Induced Drain Current Degradation
- Impact of Mobility Degradation and Supply Voltage on Negative-Bias Temperature Instability in Advanced p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors