Lin Chih-Yung | Platform-1 Division/R&D, Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan

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概要

関連著者

Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
YANG Dao-Hong
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
Wu Shien-Yang
Platform-1 Division/R&D, Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
Yang Dao-Hong
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
Lin Chih-Yung
Platform-1 Division/R&D, Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan

著作論文

Impact of Mobility Degradation and Supply Voltage on Negative-Bias Temperature Instability in Advanced p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors

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