LIN Tony | United Microelectronics Corp., technology Development Division
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概要
関連著者
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LIN Tony
United Microelectronics Corp., technology Development Division
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Lin Tony
United Microelectronics Corp. Technology Development Division
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Lin T
United Microelectronics Corp. Hsinchu Twn
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Chou J‐w
United Microelectronics Corp. Technology Development Division
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Chou Jih-wen
United Microelectronics Corporation Device Engineering Department Specially Technology Division
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Yeh W‐k
National Univ. Kaohsiung Kaohsiung Twn
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Yeh Wen-kuan
United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D
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SUN S.
United Microelectronics Corp., Specialty Technology Department, Technology & Process Development Div
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Lin Tony
United Microelectronics Corporation (umc) Central R&d Division
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Chen Coming
United Microelectronics Corp. Technology Development Division
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Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
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Lee Y.
Department Of Zoology National University Of Singapore
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Chang Chun-yen
Institute Of Electronics National Chiao Tung University
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HUANG Tiao-Yuan
Institute of Electronics, National Chiao Tung University
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CHANG C.
Department of Physics, National Cheng Kung University
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CHANG Sun-Jay
Institute of Electronics, National Chiao-Tung University
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Lee Yao-jen
Institute Of Electronics National Chiao Tung University
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CHEN C.
Department of Physics, Faculty of Science, Tokai University
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CHAO T.
National Nano Device Laboratory
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Luo Wen-zheng
Institute Of Electronics National Chiao Tung University
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Lee Y.
Department Of Geneticopathology Department Of Radiation Biology Research Institute For Nuclear Medic
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Chen Coming
Institute Of Electronics National Chiao Tung University
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Chang C.
Department Of Electronic Engineering National Chiao Tung University
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Chang C.
Department Of Anatomy Taipei Medical University
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CHEN T.
United Microelectronics Corp., Specialty Technology Department, Technology & Process Development Div
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CHAO Tien-Shen
National Nano Device Labs
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CHEN Coming
United Microelectronics Crop., Technology Development Division, Science-Based Industrial Park
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SUN Shin-Wei
United Microelectronics Crop., Technology Development Division, Science-Based Industrial Park
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Sun Shin-wei
United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D
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Sun Shin-wei
United Microelectronics Crop. Technology Development Division Science-based Industrial Park
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CHANG S.
Department of Electrical Engineering, National Cheng Kung University
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WU S.
Department of Electronics Engineering, National Chiao Tung University
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CHOU J.
United Microelectronics Corp., Technology Development Division
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Yeh W.
United Microelectronics Corp. Specialty Technology Department Technology & Process Development D
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Yeh W.
United Microelectronics Corp. Technology Development Division
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Chou Jih-wen
United Microelectronics Crop. Technology Development Division Science-based Industrial Park
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Chen Coming
United Microelectronics Crop. Technology Development Division Science-based Industrial Park
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Lin Tony
United Microelectronics Crop. Technology Development Division Science-based Industrial Park
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Yeh Wen-kuan
United Microelectronics Crop. Technology Development Division Science-based Industrial Park
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Chen C.
Department Of Electrical Engineering National Central University
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Lee Y.
Department Of Anesthesiology Chang Gung Memorial Hospital Lin-kou Medical Center
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Chen C.
Department Of Aeronautics And Astronautics National Cheng-kung University
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Wu S.
Department Of Electronic Engineering National Chiao Tung University
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Chou J.
United Microelectronics Corp. Technology Development Division
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Lee Y.
Department Of Electronic Engineering National Chiao Tung University
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Wu S.
Department Of Anatomy And K.k. Leung Brain Research Centre Faculty Of Basic Medicine Fourth Military
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Chang S.
Department Of Electronic Engineering National Chiao Tung University
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Chao T.
National Nano Device Labs.
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Chang S.
Department Of Electrical Engineering National Cheng Kung University
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Chou Jih-Wen
United Microelectronics Corp.
著作論文
- The Effects of Super-Steep-Retrograde Indium Channel Profile on Deep Submicron n-Channel Metal-Oxide-Semiconductor Field-Effect Transistor
- A Novel Shallow Trench Isolation with Mint-Spacer Technology
- High Performance Sub-0.1μm Dynamic Threshold MOSFET Using Indium Channel Implantation
- A Novel Shallow Trench Isolation with Mini-Spacer Technology