OKIHARA Masao | VLSI R&D Center, Oki Electric Industry Co., Ltd.
スポンサーリンク
概要
関連著者
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Hirashita Norio
Vlsi Research And Development Center Oki Electric Industry Co. Ltd.
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Hirashita Norio
Vlsi R&d Center Oki Electric Industry Co. Ltd.
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OKIHARA Masao
VLSI R&D Center, Oki Electric Industry Co., Ltd.
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Okihara Masao
Vlsi R&d Center Oki Electric Industry Co. Ltd.
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Ikeda S
Tohoku Univ. Sendai‐shi Jpn
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IKEDA Satoshi
VLSI R&D Center, Oki Electric Industry Co., Ltd.
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UCHIDA Hidetsugu
VLSI R&D Center, Oki Electric Industry Co., Ltd.
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Okihara M
Oki Electric Ind. Co. Ltd. Tokyo Jpn
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Kuroda Shigeki
Vlsi Research And Development Center Oki Electric Industry Co. Ltd.
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Itoh Masahiro
VLSI Research and Development Center, Oki Electric Industry Co., Ltd.
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Itoh Masahiro
Vlsi Research And Development Center Oki Electric Industry Co. Ltd.
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Kuroda S
Vlsi Research And Development Center Oki Electric Industry Co. Ltd.
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IKEDA Satoshi
VLSI R&D Center, Oki Electric Industry Co., Ltd.
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Hirashita Norio
VLSI R&D Center, Oki Electric Industry Co., Ltd.
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UCHIDA Hidetsugu
VLSI R&D Center, Oki Electric Industry Co., Ltd.
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OKIHARA Masao
VLSI R&D Center, Oki Electric Industry Co., Ltd.
著作論文
- Cross-sectional Transmission Electron Microscope Studies on Intrinsic Breakdown Spots of Thin Gate Oxides
- Effect of Stress on Oxide Edge Shape of Local Oxidation of Silicon for Various Oxidation Temperatures