Hussin Fawnizu | Graduate School Of Information Science Nara Institute Of Science And Technology
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概要
- HUSSIN Fawnizu Azmadiの詳細を見る
- 同名の論文著者
- Graduate School Of Information Science Nara Institute Of Science And Technologyの論文著者
関連著者
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Fujiwara Hideo
Graduate School Of Information Science Nara Institute Of Science And Technology
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Fujiwara Hideo
Computer Design And Test Lab Nara Institute Of Science And Technology
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YONEDA Tomokazu
Graduate School of Information Science, Nara Institute of Science and Technology
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Yoneda Tomokazu
Computer Design And Test Lab Nara Institute Of Science And Technology
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Yoneda Tomokazu
Graduate School Of Information Science Nara Institute Of Science And Technology
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Yoneda Tomokazu
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Hussin Fawnizu
Graduate School Of Information Science Nara Institute Of Science And Technology
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Fujiwara Hideo
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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Fujiwara Hideo
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
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HUSSIN Fawnizu
Graduate School of Information Science, Nara Institute of Science and Technology
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Yoneda Tomokazu
Graduate School Of Information Of Science Nara Institute Of Science And Technology
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Fujiwara Hideo
Graduate School Of Information Of Science Nara Institute Of Science And Technology
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ORAILOGLU Alex
Computer Science and Engineering Department, University of California San Diego
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Orailoglu Alex
Computer Science And Engineering Department University Of California San Diego
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Hussin Fawnizu
Grad. School of Information Science, Nara Institute of Science and Technology
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Yoneda Tomokazu
Grad. School of Information Science, Nara Institute of Science and Technology
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Fujiwara Hideo
Grad. School of Information Science, Nara Institute of Science and Technology
著作論文
- NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints
- On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time
- Scheduling Power-Constrained Tests through the SoC Functional Bus
- NoC Wrapper Optimization under Channel Bandwidth and Test Time Constraints
- Power-Conscious Microprocessor-Based Testing of System-on-Chip
- Power-Conscious Microprocessor-Based Testing of System-on-Chip(テスト,システム設計及び一般)