Kang Myounggon | Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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概要
- Kang Myounggonの詳細を見る
- 同名の論文著者
- Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Natの論文著者
関連著者
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Kang Myounggon
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc)
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Kang Myounggon
Inter-University Semiconductor Research Center (ISRC)
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Song Jae
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Dong
Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul N
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Shin Hyungcheol
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Song Jae
Inter-University Semiconductor Research Center (ISRC)
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SUH Kang-Deog
Sungkyunkwan University
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Shin Hyungcheol
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
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Lim Youngho
Flash Design Team, Memory Business, Samsung Electronics Co., Ltd., Hwasung 445-701, Korea
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Suh Kang-Deog
Sungkyunkwan University, Suwon 440-746, Korea
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Park Ki-Tae
Flash Design Team, Memory Business, Samsung Electronics Co., Ltd., Hwasung 445-701, Korea
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Song Youngsun
Flash Design Team, Memory Business, Samsung Electronics Co., Ltd., Hwasung 445-701, Korea
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Kang Myounggon
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
著作論文
- RF Linearity Analysis of FinFETs using 3-D Device Simulation (先端デバイスの基礎と応用に関するアジアワークショップ(AWAD2005))
- RF Linearity Analysis of FinFETs using 3-D Device Simulation (先端デバイスの基礎と応用に関するアジアワークショップ(AWAD2005))
- Improving Read Disturb Characteristics by Using Double Common Source Line and Dummy Switch Architecture in Multi Level Cell NAND Flash Memory with Low Power Consumption