Asai H | Ntt Opto-electronics Laboratories
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概要
関連著者
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ASAI Hiromitsu
NTT Opto-electronics Laboratories
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Asai H
Ntt Opto-electronics Laboratories
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KAWAMURA Yuichi
NTT Opto-electronics Laboratories
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Kawamura Y
Ntt Opto-electronics Laboratories
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Kawamura Y
Research Institute For Advanced Science And Technology Osaka Prefecture University
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Kawamura Y
Fuji Electric Corporate Res. And Dev. Ltd. Kanagawa Jpn
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Kawamura Yuichi
Department Of Physics School Of Science And Engineering Waseda University:(present Adderss) Musashin
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KAWAMURA Yuichi
NTT Optc-electronics Laboratories
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Mikami O
Ntt Opto‐electronics Lab. Atsugi‐shi Jpn
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Mikami O
Chubu Univ. Aichi
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Mikami Osamu
Ntt Opto-electronics Laboratories
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NAGANUMA Mitsuru
NTT Opto-electronics Laboratories
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Okamura Masamichi
Musashino Electrical Communication Laboratory N.t.t.
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Naganuma M
Ntt Opto-electronics Laboratories
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Wakita Koichi
NTT Opto-electronics Laboratories
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SUZUKI Yasuhiro
NTT Opto-electronics Laboratories
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MIYAZAWA Takashi
Kanagawa Academy of Science and Technology
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MIYAZAWA Takeo
NTT Opto-electronics Laboratories
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Miyazawa Takayuki
Department Of Applied Chemistry Tokyo University Of Agriculture And Technology
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Asai Hiromitsu
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Sugiura Hideo
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Corporation
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Suzuki Yasuhiro
Ntt Optical Network Systems Laboratories:ntt Opto-electronics Laboratories
著作論文
- Resonant Tunneling Characteristic in InGaAs/InAlAs MQW Diodes with Si-Doped Quantum Wells
- Compositional Disordering of In_Ga_As/In_Al_As Multiquantum Well Structures by Repetitive Rapid Thermal Annealing
- Effects of PN-Junction on Negative Differential Resistance of InGaAs/InAlAs Multiple Quantum Well Resonant Tunneling Diodes
- Characterization and Surface Cleaning Technique for MOCVD Growth-Interrupted GaAs Films