Suh Sungho | Research Institute Of Electronics Shizuoka University
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概要
関連著者
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Suh Sungho
Research Institute Of Electronics Shizuoka University
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Kawahito Shoji
Research Institute Of Electronic Science And Technology Shizuoka University
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Itoh Sinya
Research Institute Of Electronics Shizuoka University
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Suh Sung-ho
Research Institute Of Electronics Shizuoka University
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川人 祥二
静大電研
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KAWAHITO Shoji
Research Institute of Electronics, Shizuoka University
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Suh Sungho
Research Institute of Electronics, Shizuoka University
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Itoh Shinya
Res. Inst. Of Electronics Shizuoka Univ.
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Itoh Shinya
Research Institute Of Electronics Shizuoka University
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Seo Min-woong
Research Institute Of Electronics Shizuoka University
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Takasawa Taishi
Research Institute Of Electronics Shizuoka University
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Iida Tetsuya
Research Institute Of Electronics Shizuoka University
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IIDA Tetsuya
Brookman Technology
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AKAHORI Tomoyuki
Brookman Technology
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ISOBE Keigo
Brookman Technology
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WATANABE Takashi
Brookman Technology
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Kawahito Shoji
Imaging Devices Laboratory Nanovision Research Centre Research Institute Of Electronics Shizuoka Uni
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ITOH Shinya
Research Institute of Electronics, Shizuoka University
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Suh Sung-Ho
Research Institute of Electronics, Shizuoka University
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Takasawa Taishi
Research Institute of Electronics, Shizuoka University
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Seo Min-woong
Research Institute of Electronics, Shizuoka University
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Itoh Sinya
Research Institute of Electronics, Shizuoka University
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Aoyama Satoshi
Brookman technology, Inc.
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Iida Tetsuya
Research Institute of Electronics, Shizuoka University
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Aoyama Satoshi
Brookman Technology Inc.
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Kawahito Shoji
Shizuoka Univ. Hamamatsu‐shi Jpn
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Kawahito Shoji
Shizuoka Univ. Hamainatsu‐shi Jpn
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Itoh Shinya
Shizuoka University
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Suh Sungho
Shizuoka University
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SEO Min-Woong
Shizuoka University
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WATANABE Hiroshi
Sanei Hytechs
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TAKASAWA Taishi
Shizuoka University
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Kawahito Shoji
Research Institute of Electronics, Shizuoka University:Brookman Technology
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Iida Tetsuya
Research Institute for Microbial Diseases, Osaka University
著作論文
- Noise reduction effects of column-parallel multiple sampling circuits (情報センシング)
- A column-parallel Cyclic ADC with 4bit fronted gain stage for low-noise wide dynamic range CMOS image sensors (情報センシング)
- An 80μVrms temporal noise 82dB dynamic range CMOS image sensor with a 13 to 19b variable resolution column-parallel folding integration/cyclic ADC (情報センシング・コンシューマエレクトロニクス)
- 14-1 A Low Noise Wide Dynamic Range CMOS Image Sensor Using a Column-Parallel Folding-Integration/Cyclic ADC