An Ilsin | Physics Department Hanyang University
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概要
関連著者
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An Ilsin
Physics Department Hanyang University
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Oh Hye-keun
Physics Department Hanyang University
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AN Ilsin
Physics Department, Hanyang University
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Yoo Ji-yong
Physics Department Hanyang University
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OH Hye-Keun
Physics Department, Hanyang University
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Sohn Dong-soo
Physics Department Hanyang University
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LEE Eun-Mi
Physics Department, Hanyang University
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LEE Young-Mi
Physics Department, Hanyang University
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SOHN Young-Soo
Physics Department, Hanyang University
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Kim O
Hanyang Univ.‐ansan Kyunggi‐do Kor
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HONG Seokmin
Physics Department, Hanyang University
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BAK Heungjin
Physics Department, Hanyang University
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KIM Ok
Physics Department, Hanyang University
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Cha Byung-cheol
Physics Department Hanyang University
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KWON Young-Keun
Physics Department, Hanyang University
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PARK Jun-Taek
Physics Department, Hanyang University
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HAN Woo-Sung
Physics Department, Hanyang University
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Kwon Young-keun
Physics Department Hanyang University
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SOHN Young-Soo
Department of Electrical Engineering, Pohang University of Science and Technology
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Lee Young-mi
Physics Department Hanyang University
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Lee Kun-sang
Physics Department Hanyang University
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Lee Eun-mi
Physics Department Hanyang University
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Sim Sang-jin
Physics Department Hanyang University
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Sung Moon-gyu
Department Of Physics Hanyang University
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Sohn Young-soo
Department Of Electrical Engineering Pohang University Of Science And Technology
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Sohn Young-soo
Physics Department Hanyang University
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Han Woo-sung
Physics Department Hanyang University
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Bak Heungjin
Physics Department Hanyang University
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Hong Seokmin
Physics Department Hanyang University
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Park Jun-taek
Physics Department Hanyang University
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Park Jun-teak
Physics Department Hanyang University
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Lee Hyung-joo
Physics Department Hanyang University
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Lee Sang-ho
Dongjin Chemical Co. Hwasung
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SUNG Moon-Gyu
Physics Department, Hanyang University
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OH Jin-Kyung
Physics Department, Hanyang University
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BYUN Sung-Hwan
Physics Department, Hanyang University
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JEONG Yeon-Un
Physics Department, Hanyang University
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PARK In-Ho
Physics Department, University of Inchon
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CHO Joon-Yeon
Dongjin Chemical Co., Hwasung
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Park Seung-wook
Physics Department Hanyang University
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Park In-ho
Physics Department University Of Inchon
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Oh Jin-kyung
Physics Department Hanyang University
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Cho Joon-yeon
Dongjin Chemical Co. Hwasung
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Jeong Yeon-un
Physics Department Hanyang University
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Byun Sung-hwan
Physics Department Hanyang University
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Oh H‐k
Physics Department Hanyang University
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Lee Eun-mi
Department Of Environmental Engineering Seoul National Polytechnic University
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Kim Ok
Physics Department Hanyang University
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Bak Heungjim
Physics Department, Hanyang University
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Oh Hye-Keun
Physics Department, Hanyang University, Ansan Kyunggi-Do 425-791, Korea
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Oh Hye-keun
Physics Department, Hanyang University, Ansan, Kyunggido 425-791, Korea
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Oh Hye-Keun
Physics Department, Hanyang University, Ansan, Kyunggi-Do, 425-791, Korea
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KIm Hyoung-Hee
Physics Department, Hanyang University, Ansan, Kyunggi-Do, 425-791, Korea
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Park Jun-Tack
Physics Department, Hanyang University, Ansan, Kyunggi-Do, 425-791, Korea
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Choi Jung-Wook
Physics Department, Hanyang University, Ansan, Kyunggi-Do, 425-791, Korea
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An Ilsin
Physics Department, Hanyang University, Ansan Kyunggi-Do 425-791, Korea
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An Ilsin
Physics Department, Hanyang University, Ansan, Kyunggi-Do, 425-791, Korea
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Yoo Ji-yong
Physics Department, Hanyang University, Ansan Kyunggi-Do 425-791, Korea
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Kim Jong-Hoi
Physics Department, Hanyang University, Ansan, Kyunggido 425-791, Korea
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Park Jun-teak
Physics Department, Hanyang University, Ansan Kyunggi-Do 425-791, Korea
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Cha Byung-Cheol
Physics Department, Hanyang University, Ansan, Kyunggido 425-791, Korea
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Kwon Yeong-Keun
Physics Department, Hanyang University, Ansan, Kyunggido 425-791, Korea
著作論文
- Microstructural and Electrical Properties of Ba_xSr_1-xTiO_3 Thin Films on Various Electrodes
- Threshold Energy Resist Model for Critical Dimension Prediction
- Photoresist Exposure Parameter Extraction from Refractive Index Change during Exposure
- The Extraction of Develop Parameters by Using Cross-Sectional Critical Shape Error Method
- Resist Pattern Collapse with Top Rounding Resist Profile
- Effect of Extreme Ultraviolet Light Scattering from the Rough Absorber and Buffer Side Wall