Pei Y. | Graduate School Of Advanced Sciences Of Matter Hiroshima University
スポンサーリンク
概要
関連著者
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Miyazaki Seiichi
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Nara Y.
Semiconductor Leading Edge Technology Inc.
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Miyazaki S
Hiroshima Univ. Higashi‐hiroshima Jpn
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Miyazaki Seiichi
Dept. Of Electrical Engineering Hiroshima University
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Miyazaki Seiichi
Faculty Of Engineering Hiroshima University
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INUMIYA S.
Semiconductor Leading Edge Technologies, Inc. (Selete)
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MIYAZAKI S.
Graduate School of Advanced Sciences of Matter, Hiroshima Univ.
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NARA Y.
Selete
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Pei Y.
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Murakami H.
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Higashi S.
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Pei Y.
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Miyazaki S
Department Of Electrical Engineering Hiroshima University
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Murakami H
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Inumiya S.
Semicondutor Leading Edge Technologies Inc.
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Miyazaki S
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Higashi S.
Graduate School Of Advanced Sciences Of Matter Hiroshima University
著作論文
- Evaluation of Dielectric Reliability of Ultrathin HfSiO_xN_y in Metal Gate Capacitors(Session 9A Silicon Devices VI,AWAD2006)
- Evaluation of Dielectric Reliability of Ultrathin HfSiO_xN_y in Metal Gate Capacitors(Session 9A Silicon Devices VI)
- Evaluation of Dielectric Reliability of Ultrathin HfSiO_xN_y in Metal Gate Capacitors
- Evaluation of Dielectric Reliability of Ultrathin HfSiO_xN_y in Metal Gate Capacitors