Furuta Jun | Department Of Communications And Computer Engineering Kyoto University
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概要
- FURUTA Junの詳細を見る
- 同名の論文著者
- Department Of Communications And Computer Engineering Kyoto Universityの論文著者
関連著者
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Kobayashi Kazutoshi
Graduate School Of Informatics Kyoto University
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Furuta Jun
Department Of Communications And Computer Engineering Kyoto University
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小野寺 秀俊
京都大学工学部電子工学科
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Onodera Hidetoshi
Department of Communications and Computer Engineering, Kyoto University
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Onodera H
Kyoto Univ. Kyoto‐shi Jpn
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Onodera Hidetoshi
Kyoto Univ. Kyoto‐shi Jpn
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Kobayashi Kazutoshi
Kyoto Univ. Kyoto‐shi Jpn
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Katsuki Kazuya
Department Of Communications And Computer Engineering Graduate School Of Informatics Kyoto Universit
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小野寺 秀俊
京都大学大学院工学研究科電子通信工学専攻
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Yamamoto Ryosuke
Graduate School Of Science And Technology Kobe University
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小野寺 秀俊
京都大学情報学研究科通信情報システム専攻:京都大学光・電子理工学教育研究センター
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Onodera Hidetoshi
Department of Communication and Computer Engineering, Graduate School of Informatics, Kyoto University, Kyoto 606-8501, Japan
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Onodera Hidetoshi
Department Of Communications And Computer Engineering Graduate School Of Informatics Kyoto Universit
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Kobayashi Kazutoshi
Graduate School Of Science And Technology Kyoto Institute Of Technology
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Onodera Hidetoshi
Department Of Communications And Computer Engineering Kyoto University
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Onodera Hidetoshi
Graduate School Of Informatics Kyoto University
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FURUTA Jun
Department of Communications and Computer Engineering, Kyoto University
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HAMANAKA Chikara
Graduate School of Science and Technology, Kyoto Institute of Technology
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FURUTA Jun
Graduate School of Informatics, Kyoto University
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KUBOTA Kanto
Graduate School of Science and Technology, Kyoto Institute of Technology
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Kubota Kanto
Graduate School Of Science And Technology Kyoto Institute Of Technology
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Hamanaka Chikara
Graduate School Of Science And Technology Kyoto Institute Of Technology
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Furuta Jun
Graduate School Of Informatics Kyoto University
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ZHANG Kuiyuan
Graduate School of Science and Technology, Kyoto Institute of Technology
著作論文
- An Area/Delay Efficient Dual-Modular Flip-Flop with Higher SEU/SET Immunity
- Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy Flip-Flop Measured by Shift-Register-Based Monitor Structures
- A Radiation-Hard Redundant Flip-Flop to Suppress Multiple Cell Upset by Utilizing the Parasitic Bipolar Effect