IIZUKA Hirohisa | Microelectronics Engineering Lab. Toshiba
スポンサーリンク
概要
関連著者
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MASUOKA Fujio
Research Institute of Electrical Communication, Tohoku University
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Endoh T
Tohoku Univ. Sendai‐shi Jpn
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Endoh T
Tohoku Univ. Sendai Jpn
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Endoh Tetsuo
Research Institute Of Electrical Communication Tohoku University
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Masuoka F
Tohoku Univ. Sendai Jpn
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Masuoka Fujio
Research Institute Of Electrical Communication Tohoku University
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Masuoka Fujio
The Reserch Institute Of Electrical Communication Tohoku University
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Masuoka F
Research Institute Of Electrical Communication Tohoku University
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IIZUKA Hirohisa
Microelectronics Engineering Lab. Toshiba
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Endoh T
Research Institute Of Electrical Communication Tohoku University
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Iizuka Hirohisa
Toyota Central Research & Development Labs. Inc.
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SHIROTA Riichirou
Microelectronics Engineering Lab. Toshiba
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SHIMIZU Kazuyosi
Microelectronics Engineering Lab. Toshiba
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Shirota Riichiro
Microelectronics Engineering Lab. Toshiba
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Shirota Riichiro
Toshiba Research And Development Center Ulsi Research Laboratories
著作論文
- New Write/Erase Operation Technology for Flash EEPROM Cells to Improve the Read Disturb Characteristics
- New Reduction Mechanism of the Stress Leakage Current Based on the Deactivation of Step Tunneling Sites for Thin Oxide Films