LEE Ki-Sang | R&D Center, LG Siltron Inc.
スポンサーリンク
概要
関連著者
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Yoo H‐d
R&d Center Lg Siltron Inc.
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Lee K‐s
Lg Siltron Inc. Kyungbuk Kor
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Lee Bo-young
R&d Center Lg Siltron Inc.
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LEE Ki-Sang
R&D Center, LG Siltron Inc.
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LEE Bo-Young
R&D Center, LG Siltron Inc.
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Yoo Hak-Do
R&D Center, LG Siltron Inc.
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Kim Young-hun
R & D Center Lg Siltron Inc.
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Cho W‐j
Electronics And Telecommunications Res. Inst. Daejon Kor
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Kim Y‐h
R & D Center Lg Siltron Inc.
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KIM Eun-Ha
R&D Center, LG Siltron Inc.
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KIM Young-Hun
R&D Center, LG Siltron Inc.
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CHO Won-Ju
Hyundai Electronics Co.
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Kim Eun-ha
R&d Center Lg Siltron Inc.
著作論文
- Effects of Surface Roughness and Copper Contamination on the Oxide Breakdown of Silicon Wafer(Semiconductors)
- Gate-Oxide-Integrity Characteristics of Vacancy-rich Wafer Compared with Crystal-Orginated-Pits-free Wafer as a Function of Oxide Thickness