Sakuraba Masao | Research Institute Of Electrical Communication Tohoku University
スポンサーリンク
概要
関連著者
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TSUCHIYA Toshiaki
Interdisciplinary Faculty of Science and Engineering, Shimane University
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MUROTA Junichi
Research Institute of Electrical Communication, Tohoku University
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SAKURABA Masao
Research Institute for Electrical Communications, Tohoku University
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Sakuraba Masao
Research Institute Of Electrical Communication Tohoku University
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Sakuraba Masao
Research Institute For Electrical Communications Tohoku University
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Murota Junichi
Research Institute Of Electrical Communication Tohoku University
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Murota Junichi
Research Institute For Electrical Communications Tohoku University
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Tsuchiya Toshiaki
Interdisciplinary Faculty Of Science And Engineering Shimane University
著作論文
- Quantitative Evaluation of Interface Traps in a Nanometer-Thick SiGe/Si Heterostructure in Hetero MOS Devices(Session 1 Silicon Devices I,AWAD2006)
- Quantitative Evaluation of Interface Traps in a Nanometer-Thick SiGe/Si Heterostructure in Hetero MOS Devices(Session 1 Silicon Devices I,AWAD2006)