OHSAWA Jun | Toyota Technological Institute
スポンサーリンク
概要
関連著者
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OHSAWA Jun
Toyota Technological Institute
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Kozawa Takahiro
Toyota Central R&d Laboratories Inc.
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Itoh Hiroshi
Toyota Central R&d Labs. Inc.
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Kozawa Takahiro
Toyota Central R&d Labs. Inc.
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ITOH Hiroshi
Toyota Central R&D Labs., Inc.
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Misaki Takashi
Toyota Technological Institute
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Ishiguro Osamu
Toyota Central R&d Laboratories Inc.
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Ohsawa J
Toyota Technological Institute Department Of Information-aided Technology
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YAMAGUCHI Naohiro
Toyota Technological Institute
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HARA Tamio
Toyota Technological Institute
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Hara Tamio
Toyota Technological Inst. Nagoya Jpn
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ISHIGURO Osamu
Toyota Central R&D Laboratories, Inc.
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Ishiguro Osamu
Toyota Central R&d Labs. Inc.
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Yamaguchi Naohiro
Toyota Technological Institue
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MIURA Hideki
Toyota Technological Institute
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FUJISHIMA Osamu
Toyota Central R&D Labs., Inc.
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KOBAYASHI Toshihiro
Toyota Technological Institute, Department of Information-aided Technology
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Ozaki Yasutaka
Toyota Technological Institute
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Fujishima Osamu
Toyota Central R&d Labs. Inc.
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Kobayashi Toshihiro
Toyota Technological Institute
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Kozawa Takahiro
Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan
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Hara Tamio
Toyota Technological Institute Department Of Information-aided Technology
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Misaki T
Toyota Technological Inst. Nagoya Jpn
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Misaki Takashi
Toyota Technological Institute Electron Devices Laboratory
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HAYAKAWA Soichiro
Toyota Technological Institute
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TSUCHIDA Nuio
Toyota Technological Institute
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Kawasaki Masanori
Toyota Technological Institute
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TANAKA Tatsuhiko
Toyota Technological Institute
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YOSHIDA Mitsuru
Toyota Technological Institute
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YAMAGUCHI Masafumi
Toyota Technological Institute
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Yamaguchi Naohiro
Toyota Technological Institute Department Of Information-aided Technology
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Ohsawa Jun
Toyota Technological Institute Electron Devices Laboratory
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Migitaka Masatoshi
Toyota Technological Institute
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SAIGOH Kaoru
Toyota Technological Institute
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YAMAGUCHI Satoshi
Toyota Technological Institute
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HAYASHI Hiroyuki
Toyota Technological Institute
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NAGATA Seiichi
Toyota Technological Institute, Department of Information-Aided Technology
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Yamaguchi Masafumi
Toyota Technological Institute Department Of Information-aided Technology
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Nagata Seiichi
Toyota Technological Institute Department Of Information-aided Technology
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Ohsawa Jun
Toyota Technological Institute Department Of Information-aided Technology
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Kobayashi Toshihiro
Toyota Technological Institute Department Of Information-aided Technology
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IBARAKI Toshiaki
Toyota Technological Institute
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Yamaguchi Satoshi
Toyota Central Research and Development Laboratories Inc., Nagakute, Aichi 480-1192, Japan
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Kobayashi Toshihiro
Toyota Technological Institute, Department of Information-aided Technology, 2-12 Hisakata, Tempaku-ku, Nagoya 468-8511, Japan
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Yamaguchi Naohiro
Toyota Technological Institute, Department of Information-aided Technology, 2-12 Hisakata, Tempaku-ku, Nagoya 468-8511, Japan
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Hara Tamio
Toyota Technological Institute, Department of Information-aided Technology, 2-12 Hisakata, Tempaku-ku, Nagoya 468-8511, Japan
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Miura Hideki
Toyota Technological Institute, 2-12 Hisakata, Tempaku-ku, Nagoya 468-8511, Japan
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YAMAGUCHI Satoshi
Toyota Central Research and Development Laboratories Inc.
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Fujishima Osamu
Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan
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Ishiguro Osamu
Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan
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Itoh Hiroshi
Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan
著作論文
- A GaAs Micro Solar Cell with Output Voltage over 20 V
- Asymmetric Photocurrent Characteristics in GaAs/AlGaAs Phototransistors with Very Short Carrier-Diffusion Lengths
- Selective Detection of Blue and Ultraviolet Light by An InGaN/GaN Schottky Barrier Photodiode
- Different Bias-Voltage Dependences of Photocurrent in Pt/InGaN/GaN and Pt/GaN Schottky Photodetectors on Sapphire
- Comparison of Spectral Responses between Front- and Back-Incidence Configurations in GaN Metal-Semiconductor-Metal Photodetector on Sapphire
- Low-Dark-Current Large-Area Narrow-Band Photodetector Using InGaN/GaN Layers on Sapphire
- Contactless Measurement of Young's Modulus Using Laser Beam Excitation and Detection of Vibration of Thin-Film Microresonators
- Self-Aligned Formation of Porous Silicon Membranes Using Si Diaphragm Structures : Instrumentation, Measurement, and Fabrication Technology
- Formation of β-FeSi_2 with Electron Beam Evaporation
- Higher Resistivities Obtained by Iron-Diffusion into Undoped Semi-Insulating GaAs
- Fast Micro-Photodetector for Shorter Wavelengths on Silicon-on-Insulator Structures : Optics and Quantum Electronics
- Contactless Measurement of Young’s Modulus Using Laser Beam Excitation and Detection of Vibration of Thin-Film Microresonators
- Comparison of Spectral Responses between Front- and Back-Incidence Configurations in GaN Metal–Semiconductor–Metal Photodetector on Sapphire
- Higher Picosecond Photoresponsivity Realized by Introducing Hole-Capturing Levels of Iron in GaAs
- Different Bias-Voltage Dependences of Photocurrent in Pt/InGaN/GaN and Pt/GaN Schottky Photodetectors on Sapphire