Chao Tien | Department Of Electrophysics National Chiac Tung University:nano Device Laboratories

スポンサーリンク

概要

• 同名の論文著者
• Department Of Electrophysics National Chiac Tung University:nano Device Laboratoriesの論文著者

関連著者

• Chao Tien

  Department Of Electrophysics National Chiac Tung University:nano Device Laboratories

• Chao Tien

  Department of Electronic Physics, National Chiao Tung University, 1001 Ta Hsueh Rd., Hsinchu, Taiwan

• Wang Jer

  Nanya Technology Corporation

• Lai Chao

  Department Of Electronic Engineering Chang Gung University

• Chao Tian

  Department Of Electronic Physics National Chiao Tung University

• WU Woei

  Department of Electronic Physics, National Chiao Tung University

• Wu Woei

  Department Of Electronic Physics National Chiao Tung University

• Jiang Yeu

  Department Of Electrical Engineering National Chung-hsing University

• Ma Ming

  Department Of Pharmaceutical Analysis China Pharmaceutical University

• Ma Ming

  Department Of Electronics Engineering National Chiao Tung University

• Kung Chung

  Department Of Electrical Engineering National Chung-hsing University

• WANG Tsui

  Department of Electronic Engineering, Chang Gung University

• WANG Kuan

  Department of Electronic Physics, National Chiao Tung University

• Wang Tsui

  Department Of Electronic Engineering Chang Gung University

• Wang Kuan

  Department Of Electronic Physics National Chiao Tung University

• Chan Yi

  Department Of Electrical Engineering National Central University

• HSIEN Li

  Department of Electrical Engineering, National Chung-Hsing University

• Hsien Li

  Department Of Electrical Engineering National Chung-hsing University

• Lu Tsung

  Department Of Electrophysics National Chiao Tung University

• Chan Yi

  Department Of Electrical Engineering National Chung-hsing University

• Chao Tien

  Department Of Electrophysics National Chiao Tung University

もっと見る 閉じる

著作論文

• Current Transportation Mechanism of HfO_2 Gate Dielectrics with Silicon Surface Fluorine Implantation (SSFI) in CMOS Application
• Current Transportation Mechanism and Interface States Characterization of Sputtered Gd_2O_3 Gate Dielectrics for ULSI Application
• Ultra-Shallow Junction Formation using Implantation through Capping Nitride Layer on Source/Drain Extension : Short Note
• Strain Dependence of Mobility Enhancement in Local Strain Channel nMOSFETs

スポンサーリンク