Hong Feng-lei | National Institute Of Advanced Industrial Science And Technology (aist) Aist Tsukuba Central 3
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概要
- 同名の論文著者
- National Institute Of Advanced Industrial Science And Technology (aist) Aist Tsukuba Central 3の論文著者
関連著者
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Hong Feng-lei
National Institute Of Advanced Industrial Science And Technology (aist) Aist Tsukuba Central 3
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Onae Atsushi
National Metrology Institute Of Japan
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Inaba Hajime
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Hong Feng-lei
National Research Laboratory Of Metrology
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Yasuda Masami
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Hosaka Kazumoto
National Institute Fbr Fusion Science
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Hong Feng-lei
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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ONAE Atsushi
National Research Laboratory of Metrology
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Onae A
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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Kohno Takuya
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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AKAMATSU Daisuke
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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Nakajima Yoshiaki
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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YODA Jun
National Research Laboratory of Metrology
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Okumura Koichiro
System Asic Division Ulsi Device Development Laboratories Nec Corporation
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Hong F‐l
National Res. Lab. Metrology (nrlm) Ibaraki Jpn
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Ishikawa Jun
National Research Laboratory Of Metrology
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Matsumoto Hirokazu
National Research Laboratory Of Metrology
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SASAKI Kaoru
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 3
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INABA Hajime
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and
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HIRANO Iku
National Research Laboratory of Metrology
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OKUMURA Kenichiro
National Research Laboratory of Metrology
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Yoda J
National Res. Lab. Metrology Ibaraki Jpn
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Hirano I
National Inst. Advanced Industrial Sci. And Technol. Ibaraki Jpn
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Hirano Iku
National Institute Of Advanced Industrial Science And Technology
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Matsumoto Hirokazu
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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Okumura K
Toshiba Corp. Yokohama Jpn
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Ishikawa Jun
National Institute Of Infectious Diseases
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Yoda Jun
National Institute Of Advanced Industrial Science And Technology
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Hong Feng-Lei
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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AMEMIYA Masaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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TANABE Takehiko
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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SUZUYAMA Tomonari
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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Sugawara Jun
Ceramics Division, Krosaki Harima Corporation, Kitakyushu 806-8586, Japan
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Matsumoto Hirokazu
National Institute of Advanced Industrial Science and Technology
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Hong Feng‐lei
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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HOSAKA Kazumoto
National Institute for Fusion Science
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Wadsworth William
University Of Bath Department Of Physics
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Sugiyama Kazuhiko
Graduate School Of Electronic Science And Engineering Kyoto University
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BITOU Youichi
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 3
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IWASAKI Shigeo
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 3
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Ikegami Takeshi
National Research Laboratory Of Metrology
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Ikegami Takeshi
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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KOHNO Takuya
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and
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YASUDA Masami
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and
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NAKAJIMA Yoshiaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and
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Russell Phillip
University Of Bath Department Of Physics
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SLYUSAREV Sergey
National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and T
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MINOSHIMA Kaoru
National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and T
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KNIGHT Jonathan
University of Bath, Department of Physics
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Knight Jonathan
University Of Bath Department Of Physics
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Inaba Hajime
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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Iwasaki Shigeo
National Institute Of Advanced Industrial Science And Technology (aist) Aist Tsukuba Central 3
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Hosaka Kazumoto
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Hong Feng-lei
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Bitou Youichi
National Institute Of Advanced Industrial Science And Technology (aist)
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Ishikawa Jun
National Metrology Institute Of Japan (nmij)/national Institute Of Advanced Industrial Science And T
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Katori Hidetoshi
Department Of Applied Physics Graduate School Of Engineering The University Of Tokyo
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Ikegami Takeshi
National Metology Institute Of Japan/aist
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Hong Fens-lei
National Research Laboratory Of Metrology
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HONG Feng-Lei
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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Hosaka Kazumoto
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Hong Feng-Lei
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Tanabe Takehiko
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Akamatsu Daisuke
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Suzuyama Tomonari
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Amemiya Masaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Sasaki Kaoru
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Katori Hidetoshi
Department of Applied Physics, Graduate School of Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan
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Inaba Hajime
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Iwasaki Shigeo
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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YASUDA Masami
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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Bitou Youichi
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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NAKAJIMA Yoshiaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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KOHNO Takuya
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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Kohno Takuya
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Nakajima Yoshiaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Onae Atsushi
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
著作論文
- Compact I_2-Stabilized Frequency-Doubled Nd:YAG Laser for Long Gauge Block Interferometer
- One-Dimensional Optical Lattice Clock with a Fermionic ^Yb Isotope
- Collisional Quenching Rates by He, N_2 and CH_4 for the 4D_ State in SrII
- Determination of Collisional Quenching Rate for the 4D_ State in SrII
- Optical Frequency Measurement Using Chirped-Mirror-Dispersion-Controlled Mode-Locked Ti:Al_2O_3 Laser
- Modulation-Free Saturated Dispersion Spectroscopy of I_2 Using a Common-Path Two-Colour Interferometer with a Nd : YAG Laser
- A Compact I2-Stabilized 532 nm Nd:YAG Laser
- Improved Absolute Frequency Measurement of the 171Yb Optical Lattice Clock towards a Candidate for the Redefinition of the Second
- Improved Absolute Frequency Measurement of the ^Yb Optical Lattice Clock towards a Candidate for the Redefinition of the Second
- Frequency Metrology with Optical Lattice Clocks
- Compact I2-Stabilized Frequency-Doubled Nd:YAG Laser for Long Gauge Block Interferometer
- A Fabry--Pérot Etalon with an Ultralow Expansion Ceramic Spacer
- Optical Frequency Stability Measurement of an External Cavity Blue Diode Laser with an Optical Frequency Comb
- A Fabry--Pérot Etalon with an Ultralow Expansion Ceramic Spacer