Improved Absolute Frequency Measurement of the 171Yb Optical Lattice Clock towards a Candidate for the Redefinition of the Second
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概要
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We demonstrate an improved absolute frequency measurement of the 1S0--3P0 clock transition at 578 nm in 171Yb atoms in a one-dimensional optical lattice. The clock laser linewidth is reduced to {\approx}2 Hz by phase-locking the laser to an ultrastable neodymium-doped yttrium aluminum garnet (Nd:YAG) laser at 1064 nm through an optical frequency comb with an intracavity electrooptic modulator to achieve a high servo bandwidth. The absolute frequency is determined as 518 295 836 590 863.1(2.0) Hz relative to the SI second, and will be reported to the International Committee for Weights and Measures.
- 2012-10-25
著者
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Hong Feng-lei
National Institute Of Advanced Industrial Science And Technology (aist) Aist Tsukuba Central 3
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Onae Atsushi
National Metrology Institute Of Japan
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Kohno Takuya
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Inaba Hajime
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Yasuda Masami
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Hosaka Kazumoto
National Institute Fbr Fusion Science
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Nakajima Yoshiaki
National Metrology Institute Of Japan (nmij) National Institute Of Advanced Industrial Science And T
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Hong Feng-Lei
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Tanabe Takehiko
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Akamatsu Daisuke
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Suzuyama Tomonari
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Amemiya Masaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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AMEMIYA Masaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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TANABE Takehiko
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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AKAMATSU Daisuke
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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SUZUYAMA Tomonari
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
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Inaba Hajime
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Kohno Takuya
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Nakajima Yoshiaki
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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Onae Atsushi
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan
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