Papis E | Institute Of Electron Technology
スポンサーリンク
概要
Institute Of Electron Technology | 論文
- Mesoscopic Phenomena in Microstructures of IV-VI Epilayers
- TEM Characterisation of Silicide Phase Formation in Ni-Based Ohmic Contacts to 4H n-SiC
- Doping-Induced Contrast in the Refractive Index for GaInN/GaN Structures at Telecommunication Wavelengths
- Transmission electron microscopy analysis of FeAs precipitates formed in GaAs/AlGaAs heterostructures
- Electron Microscopy Studies of Non-Local Effects' Impact on Cathodoluminescence of Semiconductor Laser Structures