KUROIWA Reiko | The Institute of Scientific and Industrial Research, Osaka University
スポンサーリンク
概要
関連著者
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ASAHI Hajime
The Institute of Scientific and Industrial Research, Osaka University
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ASAMI Kumiko
The Institute of Scientific and Industrial Research, Osaka University
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GONDA Shun-ichi
The Institute of Scientific and Industrial Research, Osaka University
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KUROIWA Reiko
The Institute of Scientific and Industrial Research, Osaka University
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IWATA Kakuya
The Institute of Scientific and Industrial Research, Osaka University
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Iwata K
Optoelectronic Materials And Devices Group Photonics Research Institute National Institute Of Advanc
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Asahi H
Osaka Univ. Osaka Jpn
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Asahi Hajime
The Institute Of Scientific And Industrial Research Osaha University
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Asami K
The Institute Of Scientific And Industrial Research Osaka University
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Asami Kumiko
The Institute Of Scientific And Industrial Research Osaha University
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Gonda S
The Institute Of Scientific And Industrial Research Osaka University
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Gonda Satoshi
National Metrology Institute Of Japan National Institute Of Advanced Industrial Science And Technolo
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Kuroiwa Reiko
The Institute Of Scientific And Industrial Research Osaka University
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Gonda Shun-ichi
The Institute Of Scientific And Industrial Research Osaka University
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Kim S‐j
Pohang Univ. Sci. And Technol. Kyungbuk Kor
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Kim Seong-jin
Division Of Electronics And Information Technology Kist
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NOH Joo-Hyong
Yokogawa Electric Corporation
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KIM Seong-Jin
The Institute of Scientific and Industrial Research, Osaka University
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NOH Joo-Hyong
The Institute of Scientific and Industrial Research, Osaka University
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Noh J‐h
Yokohama National Univ. Yokohama Jpn
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Kim Seong-jin
The Institute Of Scientific And Industrial Research Osaka University:(present Address) Electrotechni
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Noh Joo-hyong
The Institute Of Scientific And Industrial Research Osaka University
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Kim S‐j
National Institute For Material Science (nims):new Industry Creation Hatchery Center (niche) Tohoka
著作論文
- Gas Source Molecular Beam Epitaxy Growth of GaN-Rich Side of GaNP Alloys and Their Observation by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
- GaN-Rich Side of GaNAs Grown by Gas Source Molecular Beam Epitaxy
- Gas Source Molecular Beam Epitaxy Growth of GaN on C-, A-, R- and M-Plane Sapphire and Silica Glass Substrates