Jeong Tae | Devices & Materials Laboratory Lg Electronics Institute Of Technology
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概要
関連著者
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Jeong Tae
Devices & Materials Laboratory Lg Electronics Institute Of Technology
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Seo Hun
Devices & Materials Research Lab., LG Corporate Institute of Technology
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KIM Sang
Department of Metallic and Materials Engineering, Gyeongsang National University
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Park J
Yonsei Univ. Seoul Kor
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Jeong T
Lg Electronics Inst. Technol. Seoul Kor
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Park J
豊橋技科大
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Yeon Cheong
Devices & Materials Research Lab., LG Corporate Institute of Technology
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Park Jaehyuk
Department Of Electrical & Electronic Engineering. Toyohashi University Of Technology
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Yeon C
Devices And Materials Laboratory Lg Corporate Institute Of Technology
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PARK Jeong
Devices and Materials Lab. , LG Corporate Institute of Technnology
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Park Jin
Semiconductor R&d Goldstar Electron Co. Ltd.
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Kim S
Department Of Molecular Science And Technology Ajou University
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Seo H
School Of Science And Engineering Waseda University:crest Jst (japan Science And Technology Corporat
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LEE Kwang
Devices and Materials Laboratory, LG Electronics Institute of Technology
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CHOI Sung
Devices and Materials Laboratory, LG Electronics Institute of Technology
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LIM Hanjo
Department of Molecular Science & Technology, Ajou University
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KIM Sang
Department of Anesthesiology and Pain Medicine, Chosun University Medical School
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KIM Sang
Department of Agricultural Biotechnology, Seoul National University
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Park Young
Department of Internal Medicine, Seoul National University College of Medicine, Cardiovascular Labor
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Park J
Memory R&d Center Hyundai Electronics Industries Co. Ltd.
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Park Jin
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
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Park Jin
R&d Division Lg Semicon. Co. Ltd.
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Kim Myong
Devices & Materials Research Lab., LG Corporate Institute of Technology
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Park J
Hyundai Microelectronics Co. Ltd. Chungju Kor
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LEE Jeong
Devices and Materials Laboratory, LG Corporate Institute of Technology
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PARK Kyu
Devices and Materials Laboratory, LG Corporate Institute of Technology
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Choi S
Devices And Materials Laboratory Lg Electronics Institute Of Technology
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Seo Hun
Devices & Materials Laboratory Lg Electronics Institute Of Technology
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Park Kyu
Devices And Materials Laboratory Lg Corporate Institute Of Technology
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Lee Jeong
Devices And Materials Laboratory Lg Corporate Institute Of Technology
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LAH Sang
Department of Chemistry, Ajou University
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Lah Sang
Department Of Chemistry Ajou University
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Park Young
Department Of Biology Kyung Hee University
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Kim Sang
Department of Molecular Science & Technology, Ajou University, Suwon 442-749, Korea
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YEON Cheong
Devices and Materials Lab. , LG Corporate Institute of Technnology
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Park Young
Department of Chemistry, Ajou University, Suwon 442-749, Korea
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Lim Hanjo
Department of Molecular Science & Technology, Ajou University, Suwon 442-749, Korea
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KIM Myong
Devices and Materials Lab. , LG Corporate Institute of Technnology
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JEONG Tae
Devices and Materials Lab. , LG Corporate Institute of Technnology
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Jeong Tae
Devices & Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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SEO Hun
Devices and Materials Lab. , LG Corporate Institute of Technnology
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Seo Hun
Devices & Materials Laboratory, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Seo Hun
Devices and Materials Laboratory, LG Electronics Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
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Lah Sang
Department of Chemistry, Ajou University, Suwon 442-749, Korea
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Choi Sung
Devices and Materials Laboratory, LG Electronics Institute of Technology, 16 Woomyeon-Dong, Seocho-Gu, Seoul 137-724, Korea
著作論文
- Crystal Structure and Microstructure of Nitrogen-Doped Ge_2Sb_2Te_5 Thin Film
- Suppression of Jitter Bump GeSbTe Phase-Change Optical Disk
- Study of Oxygen-Doped GeSbTe Film and Its Effect as an Interface Layer on the Recording Properties in the Blue Wavelength
- Spectro-Ellipsometry Investigation of Cascaded Crystallization Behavior of Phase-Change Ge-Sb-Te Alloy
- Spectro-Ellipsometry Investigation of Cascaded Crystallization Behavior of Phase-Change Ge–Sb–Te Alloy
- Study of Oxygen-Doped GeSbTe Film and Its Effect as an Interface Layer on the Recording Properties in the Blue Wavelength