Jung Sung-woo | National Center For Nanomaterials Technology (ncnt)
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概要
関連著者
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Jung Sung-woo
National Center For Nanomaterials Technology (ncnt)
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Jeong Yoon-Ha
Dept. of Electronic and Electrical Engineering, Pohang University of Science and Technology
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Jeong Yoon-ha
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Jeong Yoon-ha
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology:national
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Jeong Yoon-ha
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology:national
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Jung Sung‐woo
National Center For Nanomaterials Technol. (ncnt) Gyeongbuk Kor
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Choi Gil-bok
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Kim Bo-sung
Lcd R&d Center Lcd Business Samsung Electronics Co. Ltd.
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Back Rock-hyun
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Kang Hee-sung
System Lsi Division Samsung Electronics Co. Ltd.
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Hong Seung-ho
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Sohn Chang-Woo
Dept. of Electronic and Electrical Engineering, Pohang University of Science and Technology
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Song Keun-Kyu
LCD R&D Center LCD Business, Samsung Electronics Co., Ltd.
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Shin Seong-Sik
LCD R&D Center LCD Business, Samsung Electronics Co., Ltd.
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Song Keun-kyu
Lcd R&d Center Lcd Business Samsung Electronics Co. Ltd.
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Sohn Chang-woo
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Shin Seong-sik
Lcd R&d Center Lcd Business Samsung Electronics Co. Ltd.
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Baek Rock-Hyun
Dept. of Electronic and Electrical Engineering, Pohang University of Science and Technology
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BAEK Chang-Ki
Korea Institute for Advanced Study
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Kim Jae-chul
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Song Seung-hyun
Dept. Of Electronic And Electrical Engineering Pohang University Of Science And Technology
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Yun Young
Semiconductor Device Research Center Matsushita Electric Industrial Co. Ltd.
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Rock-Hyun Baek
Pohang University of Science and Technology (POSTECH), Department of Electronic and Electrical Engineering, Gyeongbuk, Pohang 790-784, Republic of Korea
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Baek Rock-Hyun
Pohang University of Science and Technology (POSTECH), Department of Electronic and Electrical Engineering, Gyeongbuk, Pohang 790-784, Republic of Korea
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Dong-Won Kim
Semiconductor R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 449-711, Republic of Korea
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Jeong-Soo Lee
National Center for Nanomaterials and Technology (NCNT), Pohang, Gyeongbuk 790-784, Republic of Korea
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Dae M.
Korea Institute for Advanced Study (KIAS), School of Computational Science, Seoul 130-722, Republic of Korea
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Yoon-Ha Jeong
National Center for Nanomaterials and Technology (NCNT), Pohang, Gyeongbuk 790-784, Republic of Korea
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Dong-Won Kim
Semiconductor R&D Center, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 449-711, Republic of Korea
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Sung-Woo Jung
National Center for Nanomaterials and Technology (NCNT), Pohang, Gyeongbuk 790-784, Republic of Korea
著作論文
- RF Characteristics for 70nm MOSFETs below 77K (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- RF Characteristics for 70nm MOSFETs below 77K (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Junction Depth Dependence of the Gate Induced Drain Leakage in Shallow Junction Source/Drain-Extension Nano-CMOS
- Effect of bias sweep on pentacene thin film transistor (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Effect of bias sweep on pentacene thin film transistor (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Comparison of Series Resistance and Mobility Degradation Extracted from n- and p-Type Si-Nanowire Field Effect Transistors Using the $Y$-Function Technique