ICHINO Kenichi | Tokyo Metropolitan University
スポンサーリンク
概要
関連著者
-
IWASAKI Kazuhiko
Tokyo Metropolitan University
-
Fukumoto Satoshi
Tokyo Metropolitan Univ. Hachioji‐shi Jpn
-
Iwasaki K
Tokyo Metropolitan Univ. Tokyo Jpn
-
Iwasaki Kazuhiko
Faculty Of System Design Tokyo Metropolitan University
-
ICHINO Kenichi
Tokyo Metropolitan University
-
ARAI Masayuki
Tokyo Metropolitan University
-
Arai Masayuki
Tokyo Metropolitan Univ. Tokyo Jpn
-
WATANABE Ko-ichi
Tokyo Metropolitan University
-
Watanabe K
Tokyo Metropolitan University
-
KAJIHARA Seiji
Kyushu Institute of Technology
-
ASAKAWA Takeshi
Tokyo Metropolitan University
-
Kajihara Seiji
Kyushu Insteitute Of Technology
-
Kajihara Seiji
Kyushu Inst. Technol. Iizuka‐shi Jpn
著作論文
- Application of Partially Rotational Scan Technique with Tester IP for Processor Circuits(Scan Testing)(Test and Verification of VLSI)
- Seed Selection Procedure for LFSR-Based Random Pattern Generators(Timing Verification and Test Generation)(VLSI Design and CAD Algorithms)
- Hybrid BIST Design for n-Detection Test Using Partially Rotational Scan(Special Issue on Test and Verification of VLSI)