WATANABE Ko-ichi | Tokyo Metropolitan University
スポンサーリンク
概要
関連著者
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ARAI Masayuki
Tokyo Metropolitan University
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IWASAKI Kazuhiko
Tokyo Metropolitan University
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Fukumoto Satoshi
Tokyo Metropolitan Univ. Hachioji‐shi Jpn
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Iwasaki K
Tokyo Metropolitan Univ. Tokyo Jpn
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Iwasaki Kazuhiko
Faculty Of System Design Tokyo Metropolitan University
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Arai Masayuki
Tokyo Metropolitan Univ. Tokyo Jpn
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ICHINO Kenichi
Tokyo Metropolitan University
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WATANABE Ko-ichi
Tokyo Metropolitan University
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Watanabe K
Tokyo Metropolitan University
著作論文
- Application of Partially Rotational Scan Technique with Tester IP for Processor Circuits(Scan Testing)(Test and Verification of VLSI)
- Seed Selection Procedure for LFSR-Based Random Pattern Generators(Timing Verification and Test Generation)(VLSI Design and CAD Algorithms)