Sakamoto Takuya | Meisei University

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Meisei University | 論文

• Evaluation of Al/Ti/n-GaN Contacts by Current Noise Measurements
• Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n-SiC Contacts by Current Noise Measurements
• Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n-SiC Contacts by Current Noise Measurements
• Evaluation of Al/Ti/n-GaN Contacts by Current Noise Measurements
• Noise in Submicron Metal-Oxide-Semiconductor Field Effect Transistors : Lateral Electron Density Distribution and Active Trap Position

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