YAMAGUCHI Nobuyuki | Meisei University
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概要
Meisei University | 論文
- Evaluation of Al/Ti/n-GaN Contacts by Current Noise Measurements
- Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n-SiC Contacts by Current Noise Measurements
- Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n-SiC Contacts by Current Noise Measurements
- Evaluation of Al/Ti/n-GaN Contacts by Current Noise Measurements
- Noise in Submicron Metal-Oxide-Semiconductor Field Effect Transistors : Lateral Electron Density Distribution and Active Trap Position