Akasaka Yoichi | LSI Research and Development Laboratory, Mitsubishi Electric corporation
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概要
LSI Research and Development Laboratory, Mitsubishi Electric corporation | 論文
- New Method for Soft-Error Mapping in Dynamic Random Access Memory Using Nuclear Microprobe
- New Dynamic RAM Cell Combined with Hi-C Structure : A-2: LSI-1
- Effects of Oxygen Concentration and Annealing Sequence on Microstructure of Separation by Implanted Oxygen Wafer with High-Temperature Annealing
- Fabrication of Storage Capacitance-Enhanced Capacitors with a Rough Electrode
- Analytical Device Model of SOI MOSFETs Including Self-Heating Effect